Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies)

TY – GEN

T1 – Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies)

AU – Henkel, Jorg

AU – Pagani, Santiago

AU – Amrouch, Hussam

AU – Bauer, Lars

AU – Samie, Farzad

N1 – Publisher Copyright:
© 2017 IEEE.

PY – 2017/5/11

Y1 – 2017/5/11

N2 – Recent advances in technologies have allowed the design of small-size low-power and low-cost devices that can be connected to the Internet, enabling the emerging paradigm of Internet-of-things (IoT). IoT covers an ever-increasing range of applications, e.g., health-care monitoring, smart homes and buildings, etc. In this invited paper, we discuss and summarize the IoT paradigm with a special focus on energy consumption and methodologies for its minimization. Furthermore, we also discuss about reliability in the context of IoT devices. In all, this paper attempts to be a starting point for readers interested in developing energy-efficient IoT devices.

AB – Recent advances in technologies have allowed the design of small-size low-power and low-cost devices that can be connected to the Internet, enabling the emerging paradigm of Internet-of-things (IoT). IoT covers an ever-increasing range of applications, e.g., health-care monitoring, smart homes and buildings, etc. In this invited paper, we discuss and summarize the IoT paradigm with a special focus on energy consumption and methodologies for its minimization. Furthermore, we also discuss about reliability in the context of IoT devices. In all, this paper attempts to be a starting point for readers interested in developing energy-efficient IoT devices.

UR – www.scopus.com/pages/publications/85020188738

U2 – 10.23919/DATE.2017.7927129

DO – 10.23919/DATE.2017.7927129

M3 – Conference contribution

AN – SCOPUS:85020188738

T3 – Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

SP – 954

EP – 959

BT – Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

PB – Institute of Electrical and Electronics Engineers Inc.

T2 – 20th Design, Automation and Test in Europe, DATE 2017

Y2 – 27 March 2017 through 31 March 2017

ER –